Microsystem Test Procedures
CataloguedThe methods of testing the quality, accuracy, and performance of microsystems and microelectromechanical systems (MEMS) and their materials and components before, during, and after the building of the systems, such as parametric tests and burn-in tests.
Microsystem Test Procedures sits under IT Support and Operations in the Information Technology domain of the Luminid skills catalogue.
Also known as
- burn-in testing
- mems performance testing
- mems test procedures
- mems testing
- micro-system test procedures
- micro-system test protocols
- microelectromechanical systems testing
- microsystem quality testing
- microsystem testing
- parametric testing
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